An Optimal Diagnosis Algorithm for Dual-Port Memories
نویسندگان
چکیده
As the development of memory technology enables the production of high density memory, the use of dual port memory increases. Therefore, testing and diagnosis of the dual port memory is important. In this paper, when a defect is detected in the memory testing process, a new diagnosis algorithm that classifies specific types of defects is proposed. The new algorithm increases fault models efficiency by using the information that can be obtained by test results as well as results using additional diagnostic pattern set. Using this algorithm, the efficient diagnosis of the dual port memory is possible with short test pattern.
منابع مشابه
An Effective Test and Diagnosis Algorithm for Dual-Port Memories
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